A pragmatic approach to testing electronic systems<br> <br> As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base.<br> <br> Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied<br> <br> to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today’s very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include:<br> * An explanation of where a test belongs in the design flow<br> * Detailed discussion of scan-path and ordering of scan-chains<br> * BIST solutions for embedded logic and memory blocks<br> * Test methodologies for FPGAs<br> * A chapter on testing system on a chip<br> * Numerous references
Principles of Testing Electronic Systems
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