An Introduction to Surface Analysis by XPS and AES

<p><b>Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis</b></p> <p>This accessible second edition of the bestselling book, <i>An Introduction to Surface Analysis by XPS and AES, 2nd Edition</i> explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. </p> <p>Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques.</p> <ul> <li>Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification</li> <li>Explores key spectroscopic techniques in surface analysis</li> <li>Provides descriptions of latest instruments and techniques</li> <li>Includes a detailed glossary of key surface analysis terms</li> <li>Features an extensive bibliography of key references and additional reading</li> <li>Uses a non-theoretical style to appeal to industrial surface analysis sectors</li> </ul> <p><i>An Introduction to Surface Analysis by XPS and AES, 2nd Edition</i> is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.</p>